An AFM instrument uses a probe with an atomically sharp tip to scan over the surface of a material. There are two main scanning modes with an AFM instrument: contact or dynamic (tapping) mode. Both ...

This shows AFM tapping amplitude signal of a diblock ring in the late stages of annealing. A Plateau-Rayleigh-like instability has developed and the ring is showing the formation of four distinct ...

For a long time, researchers contested the presence of microscopic pathogens suspected of causing various diseases in plants and animals. The invention of the electron microscope in 1933 made them ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

Click on the camera icon on the bottom toolbar. Make sure the field diaphragm knob on the front of the AFM Base is fully counterclockwise. Adjust the Fiber Light intensity as needed. Use the X/Y ...