From smartphones to laptops, we use a variety of devices every day that rely on integrated circuits (ICs), or chips, to function. These chips are made up of thousands of transistors and interconnects, ...

Nobody wants chips to fail in the field, but at 65 nanometers and below, sudden failure becomes a real threat. Among the most likely causes is electromigration, a problem that's affected ICs since the ...

The replacement of aluminum with copper interconnect wiring, first demonstrated by IBM in 1997, brought the integrated circuit industry substantial improvements in both resistance to electromigration ...

An innovative measurement technique is providing new insights on electromigration, a leading cause of premature death of microcircuits. Until recently, this phenomenon, which causes fatal shorts and ...

Electromigration (EM) is a phenomenon that has been well researched and understood by the design community. At mature nodes, its impact on digital integrated circuits, particularly signal ...

ALL but a few 1 of the numerous reports in the past few years on the application of electromigration or electrophoresis on paper have used a comparatively low voltage. Recently, however, a method of ...