2.5D/3D ICs have evolved into an innovative solution for many design and integration situations, but they present unique verification obstacles that challenge electronic design automation (EDA) tools ...
Semiconductor manufacturers rely on latch-up tests to characterize ICs for susceptibility to electrical failure. Engineers can use various methods to perform latch-up tests, but the only standard that ...
If you leave signals applied to the inputs of a CMOS chip with the power turned off, the chip might explode when you re-apply power. This is called latchup. Similarly, if you drag the outputs of a ...
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