Test is a dirty business. It can contaminate a unit or wafer, or the test hardware, which in turn can cause problems in the field. While this has not gone unnoticed, particularly as costs rise due to ...

Every wafer test touch-down requires a balance between a good electrical contact and preventing damage to the wafer and probe card. Done wrong, it can ruin a wafer and the customized probe card and ...

PARIS — Probe card manufacturer Mesatronic SA is ramping up production of die-on-die (DOD) membrane probes for IC testing, in its 100 class clean room near Grenoble, France. The company is also ...