Relying solely on end-of-line testing isn't enough when security, traceability, and mission reliability are vital.
Charlotte, N.C. — The IC design community has begun to question its goal of achieving fewer than 100 defective parts per million. Citing the difficulty and costs associated with the stringent ...
SEOUL, South Korea, Nov. 10, 2025 /PRNewswire/ -- System reliability and safety are paramount across industries such as semiconductors, energy, automotive, and steel, where even microscopic cracks or ...
Today's systematic and more subtle random defects are not only decreasing yields, but are also increasing the number of test escapes, or defective parts per million (DPPM) shipped out. One of the ...
Final electrical test remains one of the best ways to assess a circuit’s ultimate viability. But we know that, unfortunately, even 100% end-of-line electrical testing of semiconductor wafers will not ...
This illustration depicts a non-destructive evaluation system empowered by generative artificial intelligence (AI) to simulate and analyze internal material defects. Leveraging virtual defect ...
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