FormFactor announced at the International Test Conference a new family of wafer probe cards designed to address the rising cost and technology challenges associated with testing wire-bond logic and ...

NORTH READING, Mass.--(BUSINESS WIRE)-- Teradyne, a leading provider of automated test equipment, has partnered with ficonTEC, a global leader in production solutions for photonics assembly and test, ...

On-wafer probing techniques have become indispensable in the precise characterisation of semiconductor devices operating in the microwave and terahertz regions. These techniques enable the direct ...

LIVERMORE, Calif., Oct. 02, 2019 (GLOBE NEWSWIRE) -- FormFactor, Inc. (NASDAQ:FORM), a leading electrical test and measurement supplier to the semiconductor industry ...

Winooski, VT. SemiProbe Inc. announced it has installed a 200-mm fully automatic electro-optical probe system at VTT Technical Research Centre of Finland Ltd. VTT has silicon photonics design and ...

The wafer probing scheduling problem (WPSP) is a variation of the parallel-machine scheduling problem, which has many real-world applications, particularly, in the integrated circuit (IC) ...

Leuven, Belgium. Imec and Cascade Microtech, a FormFactor company, have announced the successful development of a fully automatic system for pre-bond testing of advanced 3D chips. Pre-bond testing is ...

Taiwan-based wafer probing houses including King Yuan Electronics (KYEC), Sigurd Microelectronics and Ardentec have all seen order visibility extended well into 2022, driven by international ...

BEAVERTON, Ore.–Probe-card specialist Cascade Microtech Inc. rolled out a software line to align wafers and RF calibration substrates in wafer probe applications. The company's Nucleus Vision 3.0 ...

Flicker noise and random telegraph noise (RTN) testing can take a long time, especially when measuring down to frequencies of 1 Hz or below. Sweep times up to 30 min at a single temperature are common ...

Test is a dirty business. It can contaminate a unit or wafer, or the test hardware, which in turn can cause problems in the field. While this has not gone unnoticed, particularly as costs rise due to ...